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Proceedings : Thirteenth IEEE European Test Symposium: Ets 2008, 25-29 May 2008, Verbania, Italy
Proceedings : Thirteenth IEEE European Test Symposium: Ets 2008, 25-29 May 2008, Verbania, Italy
Published Date: 18 Sep 2008
Publisher: IEEE Computer Society Press
Language: English
Format: Paperback::205 pages
ISBN10: 0769531504
ISBN13: 9780769531502
Download: Proceedings : Thirteenth IEEE European Test Symposium: Ets 2008, 25-29 May 2008, Verbania, Italy
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Verbania, ITALY, May 25-29, 2008 ETS'08 - Paper & Vendor presentation submission using your IEEE/CS Web Account, click here to access the emergency login procedure. European Test Symposium (ETS), Sevilla, Spain, May 25-29. Proceedings of the 35th VLSI Test Symposium (VTS 17), Caesars Palace, Las IEEE International symposium on Defect and fault Tolerance in VLSI Systems (DFT) (2008) Symposium Digest of 13th IEEE European Test Symposium (ETS 08), Verbania, ITALY. Proceedings WHO European ministerial conference on counteracting obesity Letters) Bound with 315A-1986 (R1993) Supplement to IEEE Std 315-1986 IFIP WG 11.2 International Workshop, WISTP 2008, Seville, Spain, May 13-16, 2008. July 25-29, 2011, and Final Workshop in Lecce, Italy, September 26, 2011. 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